Nanoindentation, high-angular resolution electron backscatter diffraction (HR-EBSD), and transmission electron microscopy data in synthetic forsterite bicrystal samples (NERC Grant NE/S00162X/1)
The data are nanoindentation, high-angular resolution electron backscatter diffraction (HR-EBSD), and transmission electron microscopy data collected on samples of synthetic forsterite bicrystals at room temperature. The data were collected in two samples, with high- and low- angle grain boundaries (HAGB, 60°, [100]/(011) and SB, 13°, [100]/(016)). The EBSD data are the basis for the HR-EBSD calculation. The HR-EBSD results are presented as Matlab data files. The nanoindentation data are categorised as a function of sample (‘ol13’ – low-angle grain boundary; and ‘ol60’ – high-angle grain boundary), and indenter tip geometry (spherical (with a 10 or 5 micron radius) and pyramidal (Berkovich). The data are presented in .xls files. The TEM data are presented as .tif files. The TEM data were collected in specific indents with various distances from the interfaces. These data have been published in the manuscript: : The Role of Grain Boundaries in Low-Temperature Plasticity of Olivine Revealed by Nanoindentation, with the DOI: 10.1029/2023JB026763
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Identification info
- Metadata Language
- English (en)
- Dataset Reference Date ()
- 2023-11-03
- Maintenance and update frequency
- notApplicable
- GEMET - INSPIRE themes, version 1.0
- BGS Thesaurus of Geosciences
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- Backscatter
- X ray diffraction
- Olivine
- NGDC Deposited Data
- Keywords ()
- Keywords
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- NERC_DDC
- Limitations on Public Access
- otherRestrictions
- Other constraints
- licenceOGL
- Use constraints
- otherRestrictions
- Other constraints
- The copyright of materials derived from the British Geological Survey's work is vested in the Natural Environment Research Council [NERC]. No part of this work may be reproduced or transmitted in any form or by any means, or stored in a retrieval system of any nature, without the prior permission of the copyright holder, via the BGS Intellectual Property Rights Manager. Use by customers of information provided by the BGS, is at the customer's own risk. In view of the disparate sources of information at BGS's disposal, including such material donated to BGS, that BGS accepts in good faith as being accurate, the Natural Environment Research Council (NERC) gives no warranty, expressed or implied, as to the quality or accuracy of the information supplied, or to the information's suitability for any use. NERC/BGS accepts no liability whatever in respect of loss, damage, injury or other occurence however caused.
- Other constraints
- Available under the Open Government Licence subject to the following acknowledgement accompanying the reproduced NERC materials "Contains NERC materials ©NERC [year]"
- Topic category
-
- Geoscientific information
- Begin date
- 2018-07-02
- End date
- 2021-10-01
Spatial Reference System
No information provided.
Distribution Information
- Data format
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.mat
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tif
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EMD File (.emd)
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DM3 File (.dm3)
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Rich Text Format (rtf)
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MS Excel
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BMP File
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.mat
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- Resource Locator
- Data
- Resource Locator
- Data
- Quality Scope
- nonGeographicDataset
- Other
- non geographic dataset
Report
- Dataset Reference Date ()
- 2011
- Explanation
- See the referenced specification
- Degree
Report
- Dataset Reference Date ()
- 2010-12-08
- Explanation
- See http://eur-lex.europa.eu/LexUriServ/LexUriServ.do?uri=OJ:L:2010:323:0011:0102:EN:PDF
- Degree
- Statement
- : Nanoindentation tests were conducted on a Nano Indenter® G200, using continuous stiffness measurement on the loading segment of the experiment. We investigated the residual impressions of the nanoindents using high-angular resolution electron backscatter diffraction (HR-EBSD). For this purpose, we collected EBSD patterns using an Oxford Instruments NordlysNano EBSD detector and stored them for subsequent cross-correlation analysis. We prepared the TEM foils using a FEI Helios® Nanolab G3 Dualbeam system at the Utrecht University microscopy center. We imaged two liftouts using an FEI Talos® F200X with an acquisition acceleration voltage of 200 kV and a beam current of 5–10 nA, also at the Utrecht University microscopy center. We additionally imaged two liftouts using a JEOL® 2100F microscope at Imperial College London. The microscope was operated with an acquisition acceleration voltage of 200 kV, and an emission current of 120 μA.
Metadata
- File identifier
- 0bc51c9d-10cb-58ac-e063-0937940ae41d XML
- Metadata Language
- English (en)
- Resource type
- nonGeographicDataset
- Hierarchy level name
- non geographic dataset
- Metadata Date
- 2024-09-05
- Metadata standard name
- UK GEMINI
- Metadata standard version
- 2.3
British Geological Survey
Environmental Science Centre,Keyworth
,
NOTTINGHAM
,
NOTTINGHAMSHIRE
,
NG12 5GG
,
United Kingdom
+44 115 936 3100