Many tephra layers were identified in sediment cores drilled during IODP Expedition 350. Here, 1092 glass shards from 76 tephra occurrences (layer or patch) were analysed using electron probe microanalyses (EPMA). Data are not averaged, nor normalised. Geochemistry data were collected for: SiO2, TiO2, Al2O3, Cr2O3, FeO, MnO, MgO, CaO, Na2O, K2O, P2O5, SO3, Cl and O. Secondary standard data are given, as well as beam setup conditions. The data were obtained using the instruments at the University of Bristol, over two sessions during October and November 2014.
Microstructural data for rocks in the Shiant Isles Main Sill, presented as a function of stratigraphic height in the sill. The data were published: Holness et al. (2017) Contributions to Mineralogy and Petrology, 172:7. OI 10.1007/s00410-016-1325-x
120 samples of 57 tephra layers identified at IODP Expedition 350 sites (U1436 and U1437) were used in grain size analysis. Some layers have one grain size measurement, others have multiple measurements throughout the tephra layer.