Microscopy data from Basalt Samples, Reykjanes Ridge, North Atlantic Ocean IODP Expedition 395C
This data comprises various transmitted and reflected light microscopy images, scanning electron imagery, chemical mapping (energy dispersive X-ray spectroscopy), and crystallographic mapping (electron backscatter diffraction) of basalt samples. Basalt cores were taken from the Reykjanes Ridge in the North Atlantic Ocean, during IODP Expedition 395C at four sites, U1554, U1555, U1562, and U1563.
Default
Identification info
- Metadata Language
- English (en)
- Dataset Reference Date ()
- 2024-05-21
- Maintenance and update frequency
- notApplicable
- GEMET - INSPIRE themes, version 1.0
- BGS Thesaurus of Geosciences
-
- Microscopy
- Petrography
- NGDC Deposited Data
- Electron diffraction analysis
- Keywords ()
- Keywords
-
- NERC_DDC
- Limitations on Public Access
- otherRestrictions
- Other constraints
- restricted
- Other constraints
- Data under embargo until the associated papers are published. Data will be available under Open Government Licence once the embargo has been lifted.
- Use constraints
- otherRestrictions
- Other constraints
- The copyright of materials derived from the British Geological Survey's work is vested in the Natural Environment Research Council [NERC]. No part of this work may be reproduced or transmitted in any form or by any means, or stored in a retrieval system of any nature, without the prior permission of the copyright holder, via the BGS Intellectual Property Rights Manager. Use by customers of information provided by the BGS, is at the customer's own risk. In view of the disparate sources of information at BGS's disposal, including such material donated to BGS, that BGS accepts in good faith as being accurate, the Natural Environment Research Council (NERC) gives no warranty, expressed or implied, as to the quality or accuracy of the information supplied, or to the information's suitability for any use. NERC/BGS accepts no liability whatever in respect of loss, damage, injury or other occurence however caused.
- Other constraints
- Either: (i) the dataset is made freely available, e.g. via the Internet, for a restricted category of use (e.g. educational use only); or (ii) the dataset has not been formally approved by BGS for access and use by external clients under licence, but its use may be permitted under alternative formal arrangements; or (iii) the dataset contains 3rd party data or information obtained by BGS under terms and conditions that must be consulted in order to determine the permitted usage of the dataset. Refer to the BGS staff member responsible for the creation of the dataset if further advice is required. He / she should be familiar with the composition of the dataset, particularly with regard to 3rd party IPR contained in it, and any resultant use restrictions. This staff member should revert to the IPR Section (ipr@bgs.ac.uk ) for advice, should the position not be clear.
- Topic category
-
- Geoscientific information
- Begin date
- 2021-08-31
- End date
- 2023-11-15
Spatial Reference System
No information provided.
Distribution Information
- Data format
-
-
tifs
()
-
MS word
()
-
DAT files
()
-
H5oina
()
-
.bmp
()
-
.oipx
()
-
tifs
()
- Resource Locator
- Data
- Resource Locator
- Digital Object Identifier (DOI)
- Resource Locator
- Data
- Resource Locator
- Digital Object Identifier (DOI)
- Quality Scope
- nonGeographicDataset
- Other
- non geographic dataset
Report
- Dataset Reference Date ()
- 2011
- Explanation
- See the referenced specification
- Degree
Report
- Dataset Reference Date ()
- 2010-12-08
- Explanation
- See http://eur-lex.europa.eu/LexUriServ/LexUriServ.do?uri=OJ:L:2010:323:0011:0102:EN:PDF
- Degree
- Statement
- Transmitted and reflected light microscopy was performed using a ZEISS Axio Imager 2 designed specifically for materials research, automated large area mapping and correlative microscopy. SEM images, EDS, and EBSD data were collected in the University of Liverpool Scanning Electron Microscopy Shared Research Facility (SEM SRF) using a JEOL JSM 7001F FEG-SEM equipped with an Oxford Instruments Ultim-Max EDS detector and AZtec software, and a Zeiss GeminiSEM 450 variable pressure (VP) FEG-SEM, fitted with a Schottky field emission gun, an Oxford Instruments high-speed Symmetry EBSD detector, and an Oxford Instruments X-Max 50 mm2 EDS detector.
Metadata
- File identifier
- 1bc67d21-8ee3-7445-e063-0937940aeb0a XML
- Metadata Language
- English (en)
- Resource type
- nonGeographicDataset
- Hierarchy level name
- non geographic dataset
- Metadata Date
- 2024-09-12
- Metadata standard name
- UK GEMINI
- Metadata standard version
- 2.3
British Geological Survey
Environmental Science Centre,Keyworth
,
NOTTINGHAM
,
NOTTINGHAMSHIRE
,
NG12 5GG
,
United Kingdom
+44 115 936 3100